Feasibility and limitation of track studies using atomic force microscopy

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

11 Scopus Citations
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Author(s)

  • D. Nikezic
  • J. P Y Ho
  • C. W Y Yip
  • V. S Y Koo
  • K. N. Yu

Detail(s)

Original languageEnglish
Pages (from-to)293-300
Journal / PublicationNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume197
Issue number3-4
Publication statusPublished - Dec 2002

Abstract

Atomic force microscopy (AFM) has been employed to investigate characteristics of tracks of heavy charged particles in solid state nuclear track detectors (SSNTDs). In the present work, we have performed simulations of the track structures revealed by AFM based only on geometrical considerations of the tracks and two types of probes (the ultralever and the ultrahigh aspect ration probe). The purpose of this work is to determine the limitations and constraints of the AFM technique when it is applied to track investigations. The ultralever has comparable dimensions as the tracks in SSNTDs etched for a short time. In some cases, the ultralever is too large or its geometry does not match those of the tracks, so these tracks cannot be scanned properly. In most cases, the ultralever can measure the diameter of the tracks with a rather high precision, but measurements of the depths can be misleading if the track depths are larger than the length of the ultralever. The ultrahigh aspect ratio probe, with an aspect ratio better than 10:1, can record tracks with rather high accuracy if the track depths are not larger than probe length. The technique involving the mounting of nanotubes on AFM tips, which has become available in recent years, should be able to record almost perfect track profiles. © 2002 Elsevier Science B.V. All rights reserved.

Research Area(s)

  • Atomic force microscopy, CR39 detector, LR115 detector, Solid state nuclear track detector

Citation Format(s)

Feasibility and limitation of track studies using atomic force microscopy. / Nikezic, D.; Ho, J. P Y; Yip, C. W Y et al.
In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 197, No. 3-4, 12.2002, p. 293-300.

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review