Fault diagnosis using concurrent projection to latent structures
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Pages (from-to) | 1276-1281 |
Journal / Publication | IFAC-PapersOnLine |
Volume | 48 |
Issue number | 8 |
Online published | 25 Sept 2015 |
Publication status | Published - 2015 |
Externally published | Yes |
Conference
Title | 9th IFAC Symposium on Advanced Control of Chemical Processes, ADCHEM 2015 |
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Place | Canada |
City | Whistler |
Period | 7 - 10 June 2015 |
Link(s)
Abstract
Recently, a concurrent projection to latent structures (CPLS) for multivariate statistical process was proposed. It has been proved to be a better monitoring method than the traditional PLS. However, its fault diagnosis methods have not been developed yet. In this paper, we discuss a new fault diagnosis approach based on CPLS. Five monitoring indices used in CPLS are unified into two general forms. Based on these general forms, we define their complete decomposition contributions (CDC) and reconstruction-based contributions (RBC). The diagnosability of these two contribution methods is further analyzed. Finally, simulation case studies are presented to demonstrate the results.
Research Area(s)
- Concurrent projection to latent structures (CPLS), Contribution plots, Data-driven, Fault diagnosis, Process monitoring, Quality monitoring
Citation Format(s)
Fault diagnosis using concurrent projection to latent structures. / Pan, Yu C.; Dong, Yining; Qin, S. Joe.
In: IFAC-PapersOnLine, Vol. 48, No. 8, 2015, p. 1276-1281.
In: IFAC-PapersOnLine, Vol. 48, No. 8, 2015, p. 1276-1281.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review