Fault diagnosis using concurrent projection to latent structures

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

2 Scopus Citations
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Author(s)

Detail(s)

Original languageEnglish
Pages (from-to)1276-1281
Journal / PublicationIFAC-PapersOnLine
Volume48
Issue number8
Online published25 Sep 2015
Publication statusPublished - 2015
Externally publishedYes

Conference

Title9th IFAC Symposium on Advanced Control of Chemical Processes, ADCHEM 2015
PlaceCanada
CityWhistler
Period7 - 10 June 2015

Abstract

Recently, a concurrent projection to latent structures (CPLS) for multivariate statistical process was proposed. It has been proved to be a better monitoring method than the traditional PLS. However, its fault diagnosis methods have not been developed yet. In this paper, we discuss a new fault diagnosis approach based on CPLS. Five monitoring indices used in CPLS are unified into two general forms. Based on these general forms, we define their complete decomposition contributions (CDC) and reconstruction-based contributions (RBC). The diagnosability of these two contribution methods is further analyzed. Finally, simulation case studies are presented to demonstrate the results.

Research Area(s)

  • Concurrent projection to latent structures (CPLS), Contribution plots, Data-driven, Fault diagnosis, Process monitoring, Quality monitoring

Citation Format(s)

Fault diagnosis using concurrent projection to latent structures. / Pan, Yu C.; Dong, Yining; Qin, S. Joe.

In: IFAC-PapersOnLine, Vol. 48, No. 8, 2015, p. 1276-1281.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review