Fast Semiconductor Reliability Assessments Using SPRT

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

1 Scopus Citations
View graph of relations

Author(s)

  • Wei-Ting Kary Chien
  • Andrew Chung
  • Way Kuo

Related Research Unit(s)

Detail(s)

Original languageEnglish
Pages (from-to)526-538
Journal / PublicationIEEE Transactions on Reliability
Volume68
Issue number2
Online published18 Oct 2018
Publication statusPublished - Jun 2019

Abstract

The semiconductor manufacturing is one of the most sophisticated processes in modern industries. It contains hundreds of complex operations, and this makes semiconductor reliability a challenging task especially in recent years that integrated circuits (ICs) have been broadly used at much wider areas including the health cares, automotive, and aerospace applications, where safety is the major concern. To make things worse, due to the shorter product life cycles and severe competitions, time-consuming reliability tests become unacceptable. The industries are in urgent need of a fast and effective way to quickly assess reliability risks. Under all these stringent limitations and the high reliability targets, we propose a consolidated approach that consists of an efficient and effective reliability baseline (BL) management system and a test scheme developed based on sequential probability ratio test (SPRT). To ensure a trustworthy setting for the SPRT test scheme, we apply the Bayesian approach to continuously update the BL database. An integrated flow chart is introduced to elucidate our proposed methodology. It is the first time SPRT is applied on reliability risk assessments with two unknown parameters. Several actual cases from semiconductor arena are reported to demonstrate the merits and powers of our proposed methodology. From these real cases, as a side benefit, we show the wide applicability of our method, which does not limit to reliability but on yield and functionality checks as well. To facilitate the use of our method by field practitioners, we do the best to explain derivations in a plain manner and provide analysis codes in R (in Supplementary Material) to make our approach as portable as possible.

Research Area(s)

  • Baseline (BL) management, Bayesian inference, reliability assessment, semiconductor manufacturing, sequential probability ratio test (SPRT)

Citation Format(s)

Fast Semiconductor Reliability Assessments Using SPRT. / Chien, Wei-Ting Kary; Chung, Andrew; Kuo, Way.

In: IEEE Transactions on Reliability, Vol. 68, No. 2, 06.2019, p. 526-538.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review