Fast prediction of electromigration lifetime with modified mean-time-to-failure equation

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

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Mathematics

100
Time Mean Mathematics
100
Prediction Mathematics
25
Sample Mathematics
25
Accurate Prediction Mathematics
25
Electronic Product Mathematics
25
Prefactor Mathematics
25
Entropy Production Mathematics
25
Parameter Mathematics

Keyphrases

100
Mean Time to Failur... Keyphrases
100
Electromigration Keyphrases
100
Fast Prediction Keyphrases
50
Activation Energy Keyphrases
50
Current Density Keyphrases
25
Solder Joint Keyphrases
25
Empirical Formula Keyphrases
25
Electronic Products Keyphrases
25
Prediction Accuracy Keyphrases
25
Cost Savings Keyphrases
25
Two-temperature Keyphrases
25
Sn-Ag Solder Keyphrases
25
Savings Method Keyphrases
25
Onsager Keyphrases
25
Entropy Production ... Keyphrases

INIS

100
failures INIS
100
prediction INIS
100
lifetime INIS
100
equations INIS
100
electromigration INIS
33
data INIS
33
activation energy INIS
33
current density INIS
16
production INIS
16
cost INIS
16
entropy INIS

Engineering

100
Mean Time to Failur... Engineering
100
Electromigration Engineering
100
Prediction Engineering
50
Activation Energy Engineering
50
Temperature Engineering
50
Density Engineering
25
Electronics Engineering
25
Empirical Equation Engineering
25
Joints (Structural ... Engineering
25
Electronic Product Engineering
25
Accurate Prediction Engineering
25
Test Sample Engineering
25
Entropy Production Engineering

Chemical Engineering

100
Temperature Chemical Engineering
50
Entropy Chemical Engineering
Research OutputsResearch Output authored by Fast prediction of electromigration lifetime with modified mean-time-to-failure equation is tagged with the concept