Facing the Headaches of Early Failures : A State-of-the-Art Review of Burn-In Decisions

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Original languageEnglish
Pages (from-to)1257-1266
Journal / PublicationProceedings of the IEEE
Issue number11
Publication statusPublished - Nov 1983
Externally publishedYes


System screening during electronic equipment manufacturing offers cost-effective opportunities to remove and replace defective items. Burn-in is an important screening method used in predicting, achieving, and enhancing field reliability. Based on a simple calculation, we would expect the number of failures in the field to be a decreasing function of burn-in period. Especially, the expected number of failures drops significantly in the first part of the curve. Thus only a few hours of burn-in greatly reduces the failure rate, hence enhancing reliability. Qualitative studies on electronics burn-in have been done. It is well known that burn-in is costly. However, a comprehensive quantitative approach is lacking in the determination of optimal burn-in periods. This paper thoroughly reviews the studies of burn-in screenings applied to industrial products. Papers published in the past have been critically commented and systematically classified. This state-of-the-art review can serve as a guide in studying the burn-in problems. Copyright © 1983 by The Institute of Electrical and Electronics Engineers, Inc.