Abstract
Single‐ and multilayer MoS2 films are deposited onto Si/SiO2 using the mechanical exfoliation technique. The films were then used for the fabrication of field‐effect transistors (FETs). These FET devices can be used as gas sensors to detect nitrous oxide (NO). Although the single‐layer MoS2 device shows a rapid response after exposure to NO, the current was found to be unstable. The two‐, three‐, and four‐layer MoS2 devices show both stable and sensitive responses to NO down to a concentration of 0.8 ppm. Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
| Original language | English |
|---|---|
| Pages (from-to) | 63-67 |
| Journal | Small |
| Volume | 8 |
| Issue number | 1 |
| Online published | 20 Oct 2011 |
| DOIs | |
| Publication status | Published - 9 Jan 2012 |
| Externally published | Yes |
Research Keywords
- 2D nanomaterials
- field-effect transistors
- gas sensors
- mechanical exfoliation
- MoS2
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