Fabrication of a probe-lens device for scanning super-resolution imaging platform

Boliang Jia; Sam Hok Sum Lai; Fei Fei Wang; Lianqing Liu; Guanglie Zhang; Wen J. Li

doi:10.1109/NEMS.2017.8017035

Fabrication of a probe-lens device for scanning super-resolution imaging platform

Boliang Jia, Sam Hok Sum Lai, Fei Fei Wang, Lianqing Liu, Guanglie Zhang, Wen J. Li^*

^*Corresponding author for this work

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

2 Citations (Scopus)

Abstract

We present a simple and flexible approach for building a microsphere-based probe that can be used for a scanning super-resolution imaging platform. We assembled microspheres with a microprobe and manipulate the microspheres as secondary lens across the specimen surface. The achieved resolution enhancement surpasses conventional 100x/0.90 objective lens under white light illumination by adding an additional 4.6x magnification factor, allowing the platform to resolve features as small as 100nm. The work reported here advances the research field of microlens based super-resolution imaging in at least two aspects: 1) development of a process to stably and rapidly bond microspheres (as small as 20μm) on a microprobe for nanoscale scanning in 3D space; 2) realization of large field-of-view (i.e., much large than the field-of-view of a single spherical lens) sub-diffraction limited features by image-patching techniques. We foresee that the device described here can be incorporated with ultra-precision 3D scanning stages to further improve its super-resolution imaging capability in the future.

Original language	English
Title of host publication	2017 IEEE 12th International Conference on Nano/Micro Engineered and Molecular Systems (NEMS)
Publisher	IEEE
Pages	327-332
ISBN (Electronic)	978-1-5090-3059-0
DOIs	https://doi.org/10.1109/NEMS.2017.8017035
Publication status	Published - Apr 2017
Event	12th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2017 - UCLA, Los Angeles, United States Duration: 9 Apr 2017 → 12 Apr 2017 http://ieee-nems.org/2017/

Conference

Conference	12th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2017
Abbreviated title	IEEE-NEMS 2017
Country/Territory	United States
City	Los Angeles
Period	9/04/17 → 12/04/17
Internet address	http://ieee-nems.org/2017/

Research Keywords

microsphere
scanning platform
sub-diffraction limited
super-resolution

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10.1109/NEMS.2017.8017035

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@inproceedings{b628253ac64c445697dcb211c84c1563,

title = "Fabrication of a probe-lens device for scanning super-resolution imaging platform",

abstract = "We present a simple and flexible approach for building a microsphere-based probe that can be used for a scanning super-resolution imaging platform. We assembled microspheres with a microprobe and manipulate the microspheres as secondary lens across the specimen surface. The achieved resolution enhancement surpasses conventional 100x/0.90 objective lens under white light illumination by adding an additional 4.6x magnification factor, allowing the platform to resolve features as small as 100nm. The work reported here advances the research field of microlens based super-resolution imaging in at least two aspects: 1) development of a process to stably and rapidly bond microspheres (as small as 20μm) on a microprobe for nanoscale scanning in 3D space; 2) realization of large field-of-view (i.e., much large than the field-of-view of a single spherical lens) sub-diffraction limited features by image-patching techniques. We foresee that the device described here can be incorporated with ultra-precision 3D scanning stages to further improve its super-resolution imaging capability in the future.",

keywords = "microsphere, scanning platform, sub-diffraction limited, super-resolution",

author = "Boliang Jia and Lai, {Sam Hok Sum} and Wang, {Fei Fei} and Lianqing Liu and Guanglie Zhang and Li, {Wen J.}",

year = "2017",

month = apr,

doi = "10.1109/NEMS.2017.8017035",

language = "English",

pages = "327--332",

booktitle = "2017 IEEE 12th International Conference on Nano/Micro Engineered and Molecular Systems (NEMS)",

publisher = "IEEE",

address = "United States",

note = "12th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2017, IEEE-NEMS 2017 ; Conference date: 09-04-2017 Through 12-04-2017",

url = "http://ieee-nems.org/2017/",

}

Jia, B, Lai, SHS, Wang, FF, Liu, L, Zhang, G & Li, WJ 2017, Fabrication of a probe-lens device for scanning super-resolution imaging platform. in 2017 IEEE 12th International Conference on Nano/Micro Engineered and Molecular Systems (NEMS)., 8017035, IEEE, pp. 327-332, 12th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2017, Los Angeles, United States, 9/04/17. https://doi.org/10.1109/NEMS.2017.8017035

Fabrication of a probe-lens device for scanning super-resolution imaging platform. / Jia, Boliang; Lai, Sam Hok Sum; Wang, Fei Fei et al.
2017 IEEE 12th International Conference on Nano/Micro Engineered and Molecular Systems (NEMS). IEEE, 2017. p. 327-332 8017035.

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

TY - GEN

T1 - Fabrication of a probe-lens device for scanning super-resolution imaging platform

AU - Jia, Boliang

AU - Lai, Sam Hok Sum

AU - Wang, Fei Fei

AU - Liu, Lianqing

AU - Zhang, Guanglie

AU - Li, Wen J.

PY - 2017/4

Y1 - 2017/4

N2 - We present a simple and flexible approach for building a microsphere-based probe that can be used for a scanning super-resolution imaging platform. We assembled microspheres with a microprobe and manipulate the microspheres as secondary lens across the specimen surface. The achieved resolution enhancement surpasses conventional 100x/0.90 objective lens under white light illumination by adding an additional 4.6x magnification factor, allowing the platform to resolve features as small as 100nm. The work reported here advances the research field of microlens based super-resolution imaging in at least two aspects: 1) development of a process to stably and rapidly bond microspheres (as small as 20μm) on a microprobe for nanoscale scanning in 3D space; 2) realization of large field-of-view (i.e., much large than the field-of-view of a single spherical lens) sub-diffraction limited features by image-patching techniques. We foresee that the device described here can be incorporated with ultra-precision 3D scanning stages to further improve its super-resolution imaging capability in the future.

AB - We present a simple and flexible approach for building a microsphere-based probe that can be used for a scanning super-resolution imaging platform. We assembled microspheres with a microprobe and manipulate the microspheres as secondary lens across the specimen surface. The achieved resolution enhancement surpasses conventional 100x/0.90 objective lens under white light illumination by adding an additional 4.6x magnification factor, allowing the platform to resolve features as small as 100nm. The work reported here advances the research field of microlens based super-resolution imaging in at least two aspects: 1) development of a process to stably and rapidly bond microspheres (as small as 20μm) on a microprobe for nanoscale scanning in 3D space; 2) realization of large field-of-view (i.e., much large than the field-of-view of a single spherical lens) sub-diffraction limited features by image-patching techniques. We foresee that the device described here can be incorporated with ultra-precision 3D scanning stages to further improve its super-resolution imaging capability in the future.

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KW - scanning platform

KW - sub-diffraction limited

KW - super-resolution

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BT - 2017 IEEE 12th International Conference on Nano/Micro Engineered and Molecular Systems (NEMS)

PB - IEEE

T2 - 12th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2017

Y2 - 9 April 2017 through 12 April 2017

ER -

Fabrication of a probe-lens device for scanning super-resolution imaging platform

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