Exploratory study of a neural network approach for reliability data analysis

The results of this paper show that neural networks could be a very promising tool for reliability data analysis. Identifying the underlying distribution of a set of failure data and estimating its distribution parameters are necessary in reliability engineering studies. In general, either a chi-square or a non-parametric goodness-of-fit test is used in the distribution identification process which includes the pattern interpretation of the failure data histograms. However, those procedures can guarantee neither an accurate distribution identification nor a robust parameter estimation when small data samples are available. Basically, the graphical approach of distribution fitting is a pattern recognition problem and parameter estimation is a classification problem where neural networks have been proved to be a suitable tool. This paper presents an exploratory study of a neural network approach, validated by simulated experiments, for analysing small-sample reliability data. A counter-propagation network is used in classifying normal, uniform, exponential and Weibull distributions. A back-propagation network is used in the parameter estimation of a two-parameter Weibull distribution.