Exploiting Process Variation for Write Performance Improvement on NAND Flash Memory Storage Systems

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

20 Scopus Citations
View graph of relations

Author(s)

  • Liang Shi
  • Yejia Di
  • Mengying Zhao
  • Kaijie Wu
  • Edwin H.-M. Sha

Related Research Unit(s)

Detail(s)

Original languageEnglish
Article number7041199
Pages (from-to)334-337
Journal / PublicationIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume24
Issue number1
Publication statusPublished - 1 Jan 2016

Abstract

The write performance of flash memory has been degraded significantly due to the recent density-oriented advancements of flash technology. Techniques have been proposed to improve the write performance by exploiting the varying strength of a flash block in its different worn-out stages. A block is written with a faster speed when it is new and strong, and gradually will be written with slower speeds as it is aging and becomes weak. Motivated by these works, this brief proposes a new technique by exploiting the significant process variation among flash blocks introduced by the advanced technology scaling. First, a write speed detection approach is proposed to identify the strength of each block. Then, a heuristic approach is proposed to exploit the speed variation among blocks for write performance improvement. A series of trace-driven simulations shows that the proposed approach generates substantial write performance improvement over state-of-the-art approaches by 30% on average.

Research Area(s)

  • Hotness ranks, Process Variation (PV), speed groups, write performance

Citation Format(s)

Exploiting Process Variation for Write Performance Improvement on NAND Flash Memory Storage Systems. / Shi, Liang; Di, Yejia; Zhao, Mengying; Xue, Chun Jason; Wu, Kaijie; Sha, Edwin H.-M.

In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol. 24, No. 1, 7041199, 01.01.2016, p. 334-337.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review