@inproceedings{1e0492d8d1bb4d0186bdad53b8fc2043,
title = "Experimental study of ESD effect on metallic enclosure",
abstract = "Electrostatic Discharge (ESD) can cause serious problems in digital electronic devices. Indirect coupling through apertures on the metallic enclosure to the internal circuitries can also affect the performance of the devices. In this paper, we investigate experimentally the effect of the coupling field through apertures on the metallic enclosure.",
author = "Chan, \{K. H.\} and Fung, \{L. C.\} and Leung, \{S. W.\}",
year = "2002",
doi = "10.1109/ELMAGC.2002.1177477",
language = "English",
isbn = "780372778",
volume = "2002-January",
publisher = "IEEE",
pages = "490--492",
booktitle = "IEEE International Symposium on Electromagnetic Compatibility",
address = "United States",
note = "3rd International Symposium on Electromagnetic CompatibiIity, EMC 2002 ; Conference date: 21-05-2002 Through 24-05-2002",
}