EXAFS measurements of metal-decorated nanocavities in Si

G. de M. Azevedo, M. C. Ridgway, J. Betlehem, K. M. Yu, C. J. Glover, G. J. Foran

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

1 Citation (Scopus)

Fingerprint

Dive into the research topics of 'EXAFS measurements of metal-decorated nanocavities in Si'. Together they form a unique fingerprint.

Material Science