Evolution of crystallinity of GaN layers grown at low temperature on sapphire with dimethylhydrazine and triethylgallium

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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Author(s)

  • E. D. Bourret-Courchesne
  • Q. Ye
  • Kin-Man Yu
  • J. W. Ager III

Detail(s)

Original languageEnglish
Pages (from-to)89-94
Journal / PublicationJournal of Crystal Growth
Volume231
Issue number1-2
Publication statusPublished - Sept 2001
Externally publishedYes

Abstract

The crystallinity of GaN layers grown at low temperature by organometallic vapor phase epitaxy on sapphire using dimethylhydrazine and triethylgallium has been studied with Raman spectroscopy, atomic force microscopy and Rutherford backscattering spectroscopy. The layers were grown in the temperature range from 520°C to 660°C. Amorphous, possibly non-stoichiometric Ga-rich layers were produced below 560°C. Smooth layers of crystalline GaN with a disordered structure were produced between 560°C and 600°C. Rough but crystalline layers were produced at higher temperatures. The minimum temperature for production of crystalline layers occurs at about 580°C. © 2001 Published by Elsevier Science B.V.

Research Area(s)

  • A1. Characterization, A1. Nucleation, A3. Chemical vapor deposition processes, A3. Metalorganic vapor phase epitaxy, B1. Gallium compounds, B1. Nitrides, B2. Semiconducting gallium compounds, B2. Semiconducting materials

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