EVALUATION OF VARIOUS FFT METHODS FOR SINGLE TONE DETECTION AND FREQUENCY ESTIMATION

Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)

13 Scopus Citations
View graph of relations

Author(s)

Related Research Unit(s)

Detail(s)

Original languageEnglish
Title of host publicationEngineering Innovation: Voyage of Discovery
Subtitle of host publicationConference Proceedings
EditorsPaul Thorburn, John Quaicoe
PublisherIEEE
Pages211-214
Volume1
ISBN (Electronic)0700337174
ISBN (Print)0780337166
Publication statusPublished - May 1997

Publication series

NameCanadian Conference on Electrical and Computer Engineering
ISSN (Print)0840-7789

Conference

Title10th Canadian Conference on Electrical and Computer Engineering (CCECE' 97)
PlaceCanada
CitySt. Johns
Period25 - 28 May 1997

Abstract

The periodogram, implemented using the fast Fourier transform (FFT), is widely used for the detection and frequency measurement of single tones. This paper evaluates the detection and frequency estimation performance of the periodogram and its variants, such as the Welch and Bartlett methods and the polyphase-FFT. Performance results for the detection and frequency estimation performance of the periodogram and its variants are presented and compared. The standard periodogram generally gives the best detection performance and the minimum mean square frequency error for a fixed length of signal data. However, if the FFT length is fixed the Welch method gives the best performance.

Citation Format(s)

EVALUATION OF VARIOUS FFT METHODS FOR SINGLE TONE DETECTION AND FREQUENCY ESTIMATION. / Chan, Y. T.; Ma, Q.; So, H. C. et al.

Engineering Innovation: Voyage of Discovery: Conference Proceedings. ed. / Paul Thorburn; John Quaicoe. Vol. 1 IEEE, 1997. p. 211-214 (Canadian Conference on Electrical and Computer Engineering).

Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)