Skip to main navigation Skip to search Skip to main content

Estimation of internal junction temperature & thermal resistance of light-emitting diodes using external luminous flux measurements

    Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

    Abstract

    Although critical to the lifetime of LED, the junction temperature of LED cannot be measured easily. From the general photo-electro-thermal theory for LED systems, new equations for estimating the internal junction temperature T j and junction-case thermal resistance Rjc of LED from the luminous flux measurements, which can be obtained relatively easily, are presented and verified practically. These equations provide a valuable tool for checking Tj in LED system design without expensive equipment. © 2010 IEEE.
    Original languageEnglish
    Title of host publication2010 IEEE Energy Conversion Congress and Exposition, ECCE 2010 - Proceedings
    PublisherIEEE Computer Society
    Pages179-183
    ISBN (Print)9781424452866
    DOIs
    Publication statusPublished - 2010

    Publication series

    Name2010 IEEE Energy Conversion Congress and Exposition, ECCE 2010 - Proceedings

    Bibliographical note

    Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

    Research Keywords

    • LED system theory
    • Light-emitting diodes
    • Lighting

    Fingerprint

    Dive into the research topics of 'Estimation of internal junction temperature & thermal resistance of light-emitting diodes using external luminous flux measurements'. Together they form a unique fingerprint.

    Cite this