Estimating surface-roughness loss and output coupling in microdisk resonators

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

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Author(s)

Detail(s)

Original languageEnglish
Pages (from-to)1390-1392
Journal / PublicationOptics Letters
Volume21
Issue number17
Publication statusPublished - 1 Oct 1996
Externally publishedYes

Link(s)

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Link to Scopus https://www.scopus.com/record/display.uri?eid=2-s2.0-0000617802&origin=recordpage
Permanent Link https://scholars.cityu.edu.hk/en/publications/publication(710be316-b352-463c-83c5-e7f62e1b0672).html

Abstract

The volume current method is used to estimate analytically the scattering losses that are due to boundary corrugations and surface roughness in microdisk and ring resonators. The harmonic components of boundary imperfections either phase match the unguided continuum or lead to tunneling radiation. Phase-matched radiation can contribute significant loss and is only weakly dependent on disk radius. In high-index contrast devices the longitudinal electric field component is thus responsible for most of the radiation. © 1996 Optical Society of America.

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Publication fingerprints text

100
Surface Roughness Material Science
100
Resonator Material Science
100
surfaces INIS
100
losses INIS
100
coupling INIS
100
radiations INIS
100
resonators INIS
100
output INIS
100
roughness INIS
100
Microdisk Resonator Keyphrases
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Citation Format(s)

[ RIS ] [ BibTeX ]
Estimating surface-roughness loss and output coupling in microdisk resonators. / Little, Brent E.; Chu, Sai T.
In: Optics Letters, Vol. 21, No. 17, 01.10.1996, p. 1390-1392.

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review