TY - JOUR
T1 - Erratum: Quantification of tomographic PIV uncertainty using controlled experimental measurements (Applied Optics (2018) 57 (420-427) DOI
T2 - 10.1364/AO.56.00420)
AU - Liu, Ning
AU - Wu, Yue
AU - Ma, Lin
N1 - Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].
PY - 2018/10/10
Y1 - 2018/10/10
N2 - The authors made a mistake concerning equal contribution authorship [1]. Yue Wu is considered as a co-first author with equal contribution as the rest of the co-authors. The correct affiliation and authorship is as follows: Ning Liu,1,† Yue Wu,1,† and Lin Ma1,2,* 1Department of Aerospace and Ocean Engineering, Virginia Tech, Blacksburg, VA 24060, USA 2Department of Mechanical and Aerospace Engineering, University of Virginia, Charlottesville, VA 22904, USA. *Corresponding author: [email protected] †These authors contributed equally for this work. © 2018 Optical Society of America.
AB - The authors made a mistake concerning equal contribution authorship [1]. Yue Wu is considered as a co-first author with equal contribution as the rest of the co-authors. The correct affiliation and authorship is as follows: Ning Liu,1,† Yue Wu,1,† and Lin Ma1,2,* 1Department of Aerospace and Ocean Engineering, Virginia Tech, Blacksburg, VA 24060, USA 2Department of Mechanical and Aerospace Engineering, University of Virginia, Charlottesville, VA 22904, USA. *Corresponding author: [email protected] †These authors contributed equally for this work. © 2018 Optical Society of America.
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U2 - 10.1364/AO.57.008624
DO - 10.1364/AO.57.008624
M3 - Erratum
C2 - 30461935
SN - 1559-128X
VL - 57
JO - Applied Optics
JF - Applied Optics
IS - 29
ER -