Erratum: “Capillarity and electromigration effects on asperity contact evolution in microelectromechanical systems switches,” [J. Appl. Phys. 100, 054502 (2006)]

Ji Hee Kim; David J. Srolovitz; Pil-Ryung Cha; Jong-Kyu Yoon

doi:10.1063/1.5064756

Erratum: “Capillarity and electromigration effects on asperity contact evolution in microelectromechanical systems switches,” [J. Appl. Phys. 100, 054502 (2006)]

Ji Hee Kim
, David J. Srolovitz
, Pil-Ryung Cha
, Jong-Kyu Yoon

Research output: Journal Publications and Reviews › Erratum

Original language	English
Article number	179901
Journal	Journal of Applied Physics
Volume	124
Issue number	17
Online published	1 Nov 2018
DOIs	https://doi.org/10.1063/1.5064756
Publication status	Published - 7 Nov 2018
Externally published	Yes

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10.1063/1.5064756

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title = "Erratum: “Capillarity and electromigration effects on asperity contact evolution in microelectromechanical systems switches,” [J. Appl. Phys. 100, 054502 (2006)]",

author = "Kim, \{Ji Hee\} and Srolovitz, \{David J.\} and Pil-Ryung Cha and Jong-Kyu Yoon",

year = "2018",

month = nov,

day = "7",

doi = "10.1063/1.5064756",

language = "English",

volume = "124",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

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AU - Kim, Ji Hee

AU - Srolovitz, David J.

AU - Cha, Pil-Ryung

AU - Yoon, Jong-Kyu

PY - 2018/11/7

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SN - 0021-8979

VL - 124

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 17

M1 - 179901

ER -

Erratum: “Capillarity and electromigration effects on asperity contact evolution in microelectromechanical systems switches,” [J. Appl. Phys. 100, 054502 (2006)]

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Research output

Capillarity and electromigration effects on asperity contact evolution in microelectromechanical systems switches

Cite this