Erratum : “Capillarity and electromigration effects on asperity contact evolution in microelectromechanical systems switches,” [J. Appl. Phys. 100, 054502 (2006)]

Research output: Journal Publications and Reviews › Erratum

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Research Output

  1. 2006

  2. Capillarity and electromigration effects on asperity contact evolution in microelectromechanical systems switches

    Kim, J. H., Srolovitz, D. J., Cha, P.-R. & Yoon, J.-K., 1 Sept 2006, In: Journal of Applied Physics. 100, 5, 054502.

    Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

    Scopus citations: 7
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