Erratum : “Capillarity and electromigration effects on asperity contact evolution in microelectromechanical systems switches,” [J. Appl. Phys. 100, 054502 (2006)]

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)Comment/debate

Research Output

  1. 2006
  2. Capillarity and electromigration effects on asperity contact evolution in microelectromechanical systems switches

    Kim, J. H., Srolovitz, D. J., Cha, P. & Yoon, J., 1 Sep 2006, In : Journal of Applied Physics. 100, 5, 054502.

    Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journal

    Scopus citations: 6
    Check@CityULib