Erratum : “Capillarity and electromigration effects on asperity contact evolution in microelectromechanical systems switches,” [J. Appl. Phys. 100, 054502 (2006)]

Research output: Journal Publications and Reviews › Erratum

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Author(s)

Ji Hee Kim
David J. Srolovitz
Pil-Ryung Cha
Jong-Kyu Yoon

Detail(s)

Original language	English
Article number	179901
Journal / Publication	Journal of Applied Physics
Volume	124
Issue number	17
Online published	1 Nov 2018
Publication status	Published - 7 Nov 2018
Externally published	Yes

Link(s)

DOI	DOI https://doi.org/10.1063/1.5064756 Final Published version
	Check@CityULib
Link to Scopus	https://www.scopus.com/record/display.uri?eid=2-s2.0-85056089380&origin=recordpage
Permanent Link	https://scholars.cityu.edu.hk/en/publications/publication(cc553840-2c20-4bf2-adca-5369a592cb7c).html

Citation Format(s)

[ RIS ] [ BibTeX ]

Erratum: “Capillarity and electromigration effects on asperity contact evolution in microelectromechanical systems switches,” [J. Appl. Phys. 100, 054502 (2006)]. / Kim, Ji Hee; Srolovitz, David J.; Cha, Pil-Ryung et al.
In: Journal of Applied Physics, Vol. 124, No. 17, 179901, 07.11.2018.

Research output: Journal Publications and Reviews › Erratum

Kim, JH, Srolovitz, DJ, Cha, P-R & Yoon, J-K 2018, 'Erratum: “Capillarity and electromigration effects on asperity contact evolution in microelectromechanical systems switches,” [J. Appl. Phys. 100, 054502 (2006)]', Journal of Applied Physics, vol. 124, no. 17, 179901. https://doi.org/10.1063/1.5064756

Kim, J. H., Srolovitz, D. J., Cha, P.-R., & Yoon, J.-K. (2018). Erratum: “Capillarity and electromigration effects on asperity contact evolution in microelectromechanical systems switches,” [J. Appl. Phys. 100, 054502 (2006)]. Journal of Applied Physics, 124(17), Article 179901. https://doi.org/10.1063/1.5064756

Kim JH, Srolovitz DJ, Cha PR, Yoon JK. Erratum: “Capillarity and electromigration effects on asperity contact evolution in microelectromechanical systems switches,” [J. Appl. Phys. 100, 054502 (2006)]. Journal of Applied Physics. 2018 Nov 7;124(17):179901. Epub 2018 Nov 1. doi: 10.1063/1.5064756

Kim, Ji Hee ; Srolovitz, David J. ; Cha, Pil-Ryung et al. / Erratum : “Capillarity and electromigration effects on asperity contact evolution in microelectromechanical systems switches,” [J. Appl. Phys. 100, 054502 (2006)]. In: Journal of Applied Physics. 2018 ; Vol. 124, No. 17.