Erratum : “Capillarity and electromigration effects on asperity contact evolution in microelectromechanical systems switches,” [J. Appl. Phys. 100, 054502 (2006)]

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)Erratum

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Author(s)

Detail(s)

Original languageEnglish
Article number179901
Journal / PublicationJournal of Applied Physics
Volume124
Issue number17
Online published1 Nov 2018
Publication statusPublished - 7 Nov 2018
Externally publishedYes

Citation Format(s)

Erratum : “Capillarity and electromigration effects on asperity contact evolution in microelectromechanical systems switches,” [J. Appl. Phys. 100, 054502 (2006)]. / Kim, Ji Hee; Srolovitz, David J.; Cha, Pil-Ryung; Yoon, Jong-Kyu.

In: Journal of Applied Physics, Vol. 124, No. 17, 179901, 07.11.2018.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)Erratum