Enhancing Noise Robustness in Focus Measure Using Tight Framelet Features

Yan-Ran Li, Junwei Liu, Zhangtao Ye, Lixin Shen, Xiaosheng Zhuang*

*Corresponding author for this work

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

Abstract

Focus measures are widely used to assess image clarity in various fields, such as photography and computer vision. However, many existing focus measures face challenges in balancing noise robustness and measurement capability. In this letter, a novel focus measure called Variance of Tight Framelet Feature (VTFF) is proposed to address this challenge. VTFF leverages the advantages of tight framelet features and variance information in feature maps to provide a robust and accurate assessment of image focus. Experimental results on both synthetic and real-world data demonstrate its superior performance compared to recent focus measures in measurement capability, noise robustness, and real-time performance.

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Original languageEnglish
Pages (from-to)1435-1439
JournalIEEE Signal Processing Letters
Volume32
Online published20 Mar 2025
DOIs
Publication statusPublished - 2025

Funding

The work of Yan-Ran Li was supported in part by the National Natural Science Foundation of China under Grant 12471400 and in part by the Shenzhen Science and Technology Program under Grant JCYJ20230808105610021. The work of Lixin Shen was supported in part by the National Science Foundation under Grant DMS-1913039 and Grant DMS-2208385, and in part by Syracuse CUSE. The work of Xiaosheng Zhuang was supported in part by the Research Grants Council of Hong Kong under Grant CityU 11309122, Grant CityU 11302023, and Grant CityU 11301224 and in part by the Innovation and Technology Commission of Hong Kong under Grant MHP/054/22.

Research Keywords

  • Focus measure
  • noise robustness
  • tight framelet features

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