ENGINEERING HIGH Q-FACTOR MEMS RESONATORS AND PROBING LOSSES

Research output: Conference Papers (RGC: 31A, 31B, 32, 33)31A_Invited conference paper (refereed items)Yespeer-review

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Author(s)

Detail(s)

Original languageEnglish
Pages439-443
Publication statusPublished - Jun 2017

Conference

Title19th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2017
LocationKaohsiung Exhibition Center
PlaceTaiwan
CityKaohsiung
Period18 - 22 June 2017

Abstract

The quality factor (Q) of a resonator is critical to its performance be it in the context of realizing an oscillator, filter or sensor. While well-designed single-crystal silicon resonators can have Qs on par with quartz, they compare much less favorably in their electromechanical coupling efficiency. Piezoelectric-on-silicon resonators combine the merits of piezoelectric transduction with the excellent mechanical properties of single-crystal silicon, yet their Qs fall well short of material limits. The exact nature and mechanisms of losses is still not entirely clear. This paper presents an overview of research efforts to probe for the underlying losses and efforts to enhance quality factors in piezoelectric-on-silicon resonators.

Research Area(s)

  • aluminum nitride, Lamb wave modes, piezoelectric-on-silicon, quality factor, resonators, OSCILLATOR

Citation Format(s)

ENGINEERING HIGH Q-FACTOR MEMS RESONATORS AND PROBING LOSSES. / Lee, Joshua E.-Y.

2017. 439-443 19th International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2017, Kaohsiung, Taiwan.

Research output: Conference Papers (RGC: 31A, 31B, 32, 33)31A_Invited conference paper (refereed items)Yespeer-review