Energy band engineering and controlled p-type conductivity of CuAlO 2 thin films by nonisovalent Cu-O alloying

Z. Q. Yao, B. He, L. Zhang, C. Q. Zhuang, T. W. Ng, S. L. Liu, M. Vogel, A. Kumar, W. J. Zhang, C. S. Lee, S. T. Lee, X. Jiang

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

53 Citations (Scopus)

Abstract

The electronic band structure and p-type conductivity of CuAlO 2 films were modified via synergistic effects of energy band offset and partial substitution of less-dispersive Cu + 3d 10 with Cu 2+ 3d 9 orbitals in the valence band maximum by alloying nonisovalent Cu-O with CuAlO 2 host. The Cu-O/CuAlO 2 alloying films show excellent electronic properties with tunable wide direct bandgaps (∼3.46-3.87 eV); Hall measurements verify the highest hole mobilities (∼11.3-39.5 cm 2/Vs) achieved thus far for CuAlO 2 thin films and crystals. Top-gate thin film transistors constructed on p-CuAlO 2 films were presented, and the devices showed pronounced performance with I on/I off of ∼8.0 × 10 2 and field effect mobility of 0.97 cm 2/Vs. © 2012 American Institute of Physics.
Original languageEnglish
Article number62102
JournalApplied Physics Letters
Volume100
Issue number6
DOIs
Publication statusPublished - 6 Feb 2012

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