TY - JOUR
T1 - Electronic structures of defective boron nitride nanotubes under transverse electric fields
AU - Hu, Shuanglin
AU - Li, Zhenyu
AU - Zeng, X. C.
AU - Yang, Jinlong
N1 - Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].
PY - 2008/6/5
Y1 - 2008/6/5
N2 - We investigate the electronic structures of some defective boron nitride nanotubes (BNNTs) under transverse electric fields within density-functional theory. (16,0) BNNTs with antisite, carbon substitution, single vacancy, and Stone-Wales 5775 defects are studied. Under transverse electric fields, the band gaps of the defective BNNTs are reduced, similar to the pristine ones. The energy levels of the defect states vary with the transverse electric field directions, due to the different electrostatic potential shift at the defect sites induced by the electric fields. Therefore, besides electronic structure and optical property engineering, the transverse electric field can be used to identify the defect positions in BNNTs. © 2008 American Chemical Society.
AB - We investigate the electronic structures of some defective boron nitride nanotubes (BNNTs) under transverse electric fields within density-functional theory. (16,0) BNNTs with antisite, carbon substitution, single vacancy, and Stone-Wales 5775 defects are studied. Under transverse electric fields, the band gaps of the defective BNNTs are reduced, similar to the pristine ones. The energy levels of the defect states vary with the transverse electric field directions, due to the different electrostatic potential shift at the defect sites induced by the electric fields. Therefore, besides electronic structure and optical property engineering, the transverse electric field can be used to identify the defect positions in BNNTs. © 2008 American Chemical Society.
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U2 - 10.1021/jp800096s
DO - 10.1021/jp800096s
M3 - RGC 21 - Publication in refereed journal
SN - 1932-7447
VL - 112
SP - 8424
EP - 8428
JO - The Journal of Physical Chemistry C
JF - The Journal of Physical Chemistry C
IS - 22
ER -