Electron transport suppression from tip-π State interaction on Si(100)-2 × 1 surfaces

K. P. Dou, W. Fan, T. A. Niehaus, T. Frauenheim, C. L. Wang, X. H. Zhang, R. Q. Zhang

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

5 Citations (Scopus)

Abstract

We investigate the electron transport between a scanning tunneling microscope tip and Si(100)-2×1 surfaces with four distinct configurations by performing calculations using density functional theory and the nonequilibrium Green's function method. Interestingly, we find that the conducting mechanism is altered when the tip-surface distance varies from large to small. At a distance larger than the critical value of 4.06 Å, the conductance is increased with a reduction in distance owing to the π state arising from the silicon dimers immediately under the tip; this in turn plays a key role in facilitating a large transmission probability. In contrast, when the tip is closer to the substrate, the conductance is substantially decreased because the π state is suppressed by the interaction with the tip, and its contribution in the tunneling channels is considerably reduced. © 2011 American Chemical Society.
Original languageEnglish
Pages (from-to)707-712
JournalJournal of Chemical Theory and Computation
Volume7
Issue number3
DOIs
Publication statusPublished - 8 Mar 2011

Fingerprint

Dive into the research topics of 'Electron transport suppression from tip-π State interaction on Si(100)-2 × 1 surfaces'. Together they form a unique fingerprint.

Cite this