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Electroelastic singularities and intensity factors for an interface crack in piezoelectric-elastic bimaterials

C. H. Xu, Z. H. Zhou*, X. S. Xu, A. Y T Leung

*Corresponding author for this work

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Abstract

    A symplectic approach based on the Hamiltonian system is proposed to analyze the electroelastic singularities and intensity factors of an interface crack in piezoelectric-elastic bimaterials. By introducing a total unknown vector consisting of generalized displacements and stresses, the Lagrangian equations are transformed to the Hamiltonian equations which can be solved by using the method of separation of variables. The total unknown vector can be expanded analytically in symplectic eigensolutions series (zero- and non-zero-eigensolutions). The unknown coefficients of the eigensolutions series are determined from the continuity conditions at the interface (electric conductor/insulation conditions) and outer boundary conditions. The study concludes that electroelastic singularities and intensity factors directly depend on the first few terms of non-zero-eigensolutions. Numerical examples for various conditions are given to show variations of singularity orders and intensity factors. These analyses may provide some guidance for the design of piezoelectric-elastic bimaterial system.
    Original languageEnglish
    Pages (from-to)2721-2739
    JournalApplied Mathematical Modelling
    Volume39
    Issue number9
    DOIs
    Publication statusPublished - 1 May 2015

    Research Keywords

    • Interface crack
    • Piezoelectric-elastic bimaterials
    • Singularity stress/electric intensity factor
    • Symplectic approach

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