Electrical transport properties of Cu3Ge thin films

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

27 Scopus Citations
View graph of relations

Author(s)

  • M. O. Aboelfotoh
  • K. N. Tu
  • F. Nava
  • M. Michelini

Detail(s)

Original languageEnglish
Pages (from-to)1616-1619
Journal / PublicationJournal of Applied Physics
Volume75
Issue number3
Publication statusPublished - 1994
Externally publishedYes

Abstract

Resistivity, Hall-effect, and magnetoresistance measurements have been performed in the temperature range 4.2-300 K on thin films of the ε1-Cu3Ge phase that has a long-range ordered monoclinic crystal structure. The results show that ε1-Cu 3Ge is a metal with a room-temperature resistivity of ∼6 μΩ cm. The temperature dependence of resistivity follows the Block-Grüneisen model with a Debye temperature of 240±25 K. The density of charge carriers, which are predominantly holes, is ∼8×1022/cm3 and is independent of temperature and film thickness. The Hall mobility at 4.2 K is ∼ 132 cm2/V s. The elastic mean free path is found to be ∼1200 Å, which is surprisingly large for a metallic compound film. The results show that the residual resistivity is dominated by surface scattering rather than grain-boundary scattering. An increase in Ge concentration above 25 at. % (but less than 35 at. %) is found to affect the resistivity and Hall mobility, but not the density of charge carriers.

Bibliographic Note

Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

Citation Format(s)

Electrical transport properties of Cu3Ge thin films. / Aboelfotoh, M. O.; Tu, K. N.; Nava, F. et al.
In: Journal of Applied Physics, Vol. 75, No. 3, 1994, p. 1616-1619.

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review