Electrical properties of textured (KNa) 0.44Li 0.06Nb 0.84Sb 0.06Ta 0.1O 3 thick films

Fang Fu; Jiwei Zhai; Zhengkui Xu; Wangfeng Bai; Lingbing Kong

doi:10.1007/s11664-012-2197-0

Author(s)

Fang Fu
Jiwei Zhai
Zhengkui Xu
Wangfeng Bai
Lingbing Kong

Detail(s)

Original language	English
Pages (from-to)	3077-3081
Journal / Publication	Journal of Electronic Materials
Volume	41
Issue number	11
Publication status	Published - Nov 2012

Link(s)

DOI	DOI https://doi.org/10.1007/s11664-012-2197-0 Final Published version
	Check@CityULib
Link to Scopus	https://www.scopus.com/record/display.uri?eid=2-s2.0-84868584462&origin=recordpage
Permanent Link	https://scholars.cityu.edu.hk/en/publications/publication(e80b8dfa-5c01-4c3c-af2e-fc3e3c76d048).html

Abstract

Lead-free (KNa) _0.44Li _0.06Nb _0.84Sb _0.06Ta _0.1O ₃ textured thick films with 25 μm thickness were fabricated by the reactive templated grain growth method. The influence of LiSbO ₃ substitution on the degree of grain orientation was investigated. The addition of LiSbO ₃ improved the dielectric properties of the K0.5Na0.5NbO ₃ potassium sodium niobate (KNN) textured thick films. Leakage current behavior of the thick film was also reduced due to the LiSbO ₃ doping, which is explicable based on the space-charge-limited currentmechanism. Itwas also found that the problemof interface effectwas alleviated due to the presence of LiSbO ₃. Piezoelectric properties of thick film were improved dramatically owing to the co-effect of texturing and LiSbO ₃ doping, with d ₃₃* being sharply increased from 38 pm/V to 173 pm/V. © 2012 TMS.

Research Area(s)

Dielectric properties, Microstructure, Piezoelectricity, Textured thick film

Citation Format(s)

[ RIS ] [ BibTeX ]

Electrical properties of textured (KNa) 0.44Li 0.06Nb 0.84Sb 0.06Ta 0.1O 3 thick films. / Fu, Fang; Zhai, Jiwei; Xu, Zhengkui et al.
In: Journal of Electronic Materials, Vol. 41, No. 11, 11.2012, p. 3077-3081.

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

Fu, F, Zhai, J, Xu, Z, Bai, W & Kong, L 2012, 'Electrical properties of textured (KNa) 0.44Li 0.06Nb 0.84Sb 0.06Ta 0.1O 3 thick films', Journal of Electronic Materials, vol. 41, no. 11, pp. 3077-3081. https://doi.org/10.1007/s11664-012-2197-0

Fu, F., Zhai, J., Xu, Z., Bai, W., & Kong, L. (2012). Electrical properties of textured (KNa) 0.44Li 0.06Nb 0.84Sb 0.06Ta 0.1O 3 thick films. Journal of Electronic Materials, 41(11), 3077-3081. https://doi.org/10.1007/s11664-012-2197-0

Fu F, Zhai J, Xu Z, Bai W, Kong L. Electrical properties of textured (KNa) 0.44Li 0.06Nb 0.84Sb 0.06Ta 0.1O 3 thick films. Journal of Electronic Materials. 2012 Nov;41(11):3077-3081. doi: 10.1007/s11664-012-2197-0

Fu, Fang ; Zhai, Jiwei ; Xu, Zhengkui et al. / Electrical properties of textured (KNa) 0.44Li 0.06Nb 0.84Sb 0.06Ta 0.1O 3 thick films. In: Journal of Electronic Materials. 2012 ; Vol. 41, No. 11. pp. 3077-3081.