Electrical and electro-optic characterization of nonlinear polymer thin films on silicon substrate

Stefan Prorok; Marvin Schulz; Alexander Petrov; Manfred Eich; Jingdong Luo; Alex K. Jen

doi:10.1117/12.2052616

Electrical and electro-optic characterization of nonlinear polymer thin films on silicon substrate

Stefan Prorok, Marvin Schulz, Alexander Petrov, Manfred Eich, Jingdong Luo, Alex K. Jen

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

Abstract

In this paper we present electrical and electro-optical (EO) measurements of polymer thin films on silicon substrates. A method is presented on how to interpret ellipsometric measurements of the (EO) coefficient on silicon substrate by taking into account multiple reflections in each sample layer. The obtained EO coefficients on silicon substrate are compared to measurements for indium tin oxide (ITO) coated glass substrates. Electrical measurements are performed to analyze the conduction mechanisms inside the polymer film. Based on the presented experimental data different models are discussed in order to explain the differences in current density during poling between ITO coated glass substrates and silicon substrates. © 2014 Copyright SPIE.

Original language	English
Title of host publication	Proceedings of SPIE
Subtitle of host publication	Organic Photonics VI
Editors	Barry P. Rand, Chihaya Adachi , David Cheyns , Volker van Elsbergen
Publisher	SPIE
Volume	9137
ISBN (Print)	9781628410853
DOIs	https://doi.org/10.1117/12.2052616
Publication status	Published - Apr 2014
Externally published	Yes
Event	Organic Photonics VI - Brussels, Belgium Duration: 15 Apr 2014 → 16 Apr 2014

Conference

Conference	Organic Photonics VI
Place	Belgium
City	Brussels
Period	15/04/14 → 16/04/14

Research Keywords

Electro-optic polymer
poling, Silicon
Teng-Man method
thin film

Access Output

10.1117/12.2052616

Other Access Options

Check CityUHK Library

Permanent Link

Right click to copy link

Cite this

@inproceedings{a5fd407938f6451d8d3032b9621c3e24,

title = "Electrical and electro-optic characterization of nonlinear polymer thin films on silicon substrate",

abstract = "In this paper we present electrical and electro-optical (EO) measurements of polymer thin films on silicon substrates. A method is presented on how to interpret ellipsometric measurements of the (EO) coefficient on silicon substrate by taking into account multiple reflections in each sample layer. The obtained EO coefficients on silicon substrate are compared to measurements for indium tin oxide (ITO) coated glass substrates. Electrical measurements are performed to analyze the conduction mechanisms inside the polymer film. Based on the presented experimental data different models are discussed in order to explain the differences in current density during poling between ITO coated glass substrates and silicon substrates. {\textcopyright} 2014 Copyright SPIE.",

keywords = "Electro-optic polymer, poling, Silicon, Teng-Man method, thin film",

author = "Stefan Prorok and Marvin Schulz and Alexander Petrov and Manfred Eich and Jingdong Luo and Jen, {Alex K.}",

year = "2014",

month = apr,

doi = "10.1117/12.2052616",

language = "English",

isbn = "9781628410853",

volume = "9137",

editor = "Rand, {Barry P. } and {Adachi }, {Chihaya } and {Cheyns }, {David } and {Elsbergen }, {Volker van }",

booktitle = "Proceedings of SPIE",

publisher = "SPIE",

address = "United States",

note = "Organic Photonics VI ; Conference date: 15-04-2014 Through 16-04-2014",

}

Electrical and electro-optic characterization of nonlinear polymer thin films on silicon substrate. / Prorok, Stefan; Schulz, Marvin; Petrov, Alexander et al.
Proceedings of SPIE : Organic Photonics VI . ed. / Barry P. Rand; Chihaya Adachi ; David Cheyns ; Volker van Elsbergen . Vol. 9137 SPIE, 2014.

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

TY - GEN

T1 - Electrical and electro-optic characterization of nonlinear polymer thin films on silicon substrate

AU - Prorok, Stefan

AU - Schulz, Marvin

AU - Petrov, Alexander

AU - Eich, Manfred

AU - Luo, Jingdong

AU - Jen, Alex K.

PY - 2014/4

Y1 - 2014/4

N2 - In this paper we present electrical and electro-optical (EO) measurements of polymer thin films on silicon substrates. A method is presented on how to interpret ellipsometric measurements of the (EO) coefficient on silicon substrate by taking into account multiple reflections in each sample layer. The obtained EO coefficients on silicon substrate are compared to measurements for indium tin oxide (ITO) coated glass substrates. Electrical measurements are performed to analyze the conduction mechanisms inside the polymer film. Based on the presented experimental data different models are discussed in order to explain the differences in current density during poling between ITO coated glass substrates and silicon substrates. © 2014 Copyright SPIE.

AB - In this paper we present electrical and electro-optical (EO) measurements of polymer thin films on silicon substrates. A method is presented on how to interpret ellipsometric measurements of the (EO) coefficient on silicon substrate by taking into account multiple reflections in each sample layer. The obtained EO coefficients on silicon substrate are compared to measurements for indium tin oxide (ITO) coated glass substrates. Electrical measurements are performed to analyze the conduction mechanisms inside the polymer film. Based on the presented experimental data different models are discussed in order to explain the differences in current density during poling between ITO coated glass substrates and silicon substrates. © 2014 Copyright SPIE.

KW - Electro-optic polymer

KW - poling, Silicon

KW - Teng-Man method

KW - thin film

UR - http://www.scopus.com/inward/record.url?scp=84902308134&partnerID=8YFLogxK

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-84902308134&origin=recordpage

U2 - 10.1117/12.2052616

DO - 10.1117/12.2052616

M3 - RGC 32 - Refereed conference paper (with host publication)

SN - 9781628410853

VL - 9137

BT - Proceedings of SPIE

A2 - Rand, Barry P.

A2 - Adachi , Chihaya

A2 - Cheyns , David

A2 - Elsbergen , Volker van

PB - SPIE

T2 - Organic Photonics VI

Y2 - 15 April 2014 through 16 April 2014

ER -

Electrical and electro-optic characterization of nonlinear polymer thin films on silicon substrate

Abstract

Conference

Research Keywords

Access Output

Other Access Options

Permanent Link

Other Files and Links

Fingerprint

Cite this