Effects of UVC irradiation on alpha-particle track parameters in CR-39

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

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Author(s)

Detail(s)

Original languageEnglish
Journal / PublicationRadiation Measurements
Volume43
Issue numberSUPPL.1
Publication statusPublished - Aug 2008

Link(s)

DOI

DOI
Check@CityULib
Link to Scopus https://www.scopus.com/record/display.uri?eid=2-s2.0-48549103174&origin=recordpage
Permanent Link https://scholars.cityu.edu.hk/en/publications/publication(a73e36fc-f7a5-46aa-9d66-ce8d6b84aeee).html

Abstract

The effects of UVC exposure on the track etch rate Vt and the detector sensitivity V of CR-39 SSNTDs were investigated through the diameters and depths of alpha-particle tracks. Both the bulk etch rate Vb and Vt increased but V decreased. The track diameters and depths were used to derive a V function for CR-39 detectors with and without UV irradiation. © 2008 Elsevier Ltd. All rights reserved.

Research Area(s)

  • Alpha particle, CR-39, Track etch, Ultraviolet

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Publication fingerprints text

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irradiation INIS
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depth INIS
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tracks INIS
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alpha particles INIS
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particle tracks INIS
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CR-39 Keyphrases
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Track Parameters Keyphrases
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Alpha Particle Trac... Keyphrases
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UV-C Irradiation Keyphrases
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Etch Rate Engineering
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Citation Format(s)

[ RIS ] [ BibTeX ]
Effects of UVC irradiation on alpha-particle track parameters in CR-39. / Tse, K. C C; Nikezic, D.; Yu, K. N.
In: Radiation Measurements, Vol. 43, No. SUPPL.1, 08.2008.

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review