Effects of UVC irradiation on alpha-particle track parameters in CR-39

K. C C Tse; D. Nikezic; K. N. Yu

doi:10.1016/j.radmeas.2008.03.029

Effects of UVC irradiation on alpha-particle track parameters in CR-39

K. C C Tse
, D. Nikezic
, K. N. Yu

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

24 Citations (Scopus)

Abstract

The effects of UVC exposure on the track etch rate V_t and the detector sensitivity V of CR-39 SSNTDs were investigated through the diameters and depths of alpha-particle tracks. Both the bulk etch rate V_b and V_t increased but V decreased. The track diameters and depths were used to derive a V function for CR-39 detectors with and without UV irradiation. © 2008 Elsevier Ltd. All rights reserved.

Original language	English
Journal	Radiation Measurements
Volume	43
Issue number	SUPPL.1
DOIs	https://doi.org/10.1016/j.radmeas.2008.03.029
Publication status	Published - Aug 2008

Research Keywords

Alpha particle
CR-39
Track etch
Ultraviolet

Access Output

10.1016/j.radmeas.2008.03.029

Other Access Options

Check CityUHK Library

Permanent Link

Right click to copy link

Cite this

@article{a73e36fcf7a546aa9d66ce8d6b84aeee,

title = "Effects of UVC irradiation on alpha-particle track parameters in CR-39",

abstract = "The effects of UVC exposure on the track etch rate Vt and the detector sensitivity V of CR-39 SSNTDs were investigated through the diameters and depths of alpha-particle tracks. Both the bulk etch rate Vb and Vt increased but V decreased. The track diameters and depths were used to derive a V function for CR-39 detectors with and without UV irradiation. {\textcopyright} 2008 Elsevier Ltd. All rights reserved.",

keywords = "Alpha particle, CR-39, Track etch, Ultraviolet",

author = "Tse, \{K. C C\} and D. Nikezic and Yu, \{K. N.\}",

year = "2008",

month = aug,

doi = "10.1016/j.radmeas.2008.03.029",

language = "English",

volume = "43",

journal = "Radiation Measurements",

issn = "1350-4487",

publisher = "Elsevier Ltd.",

number = "SUPPL.1",

}

TY - JOUR

T1 - Effects of UVC irradiation on alpha-particle track parameters in CR-39

AU - Tse, K. C C

AU - Nikezic, D.

AU - Yu, K. N.

PY - 2008/8

Y1 - 2008/8

N2 - The effects of UVC exposure on the track etch rate Vt and the detector sensitivity V of CR-39 SSNTDs were investigated through the diameters and depths of alpha-particle tracks. Both the bulk etch rate Vb and Vt increased but V decreased. The track diameters and depths were used to derive a V function for CR-39 detectors with and without UV irradiation. © 2008 Elsevier Ltd. All rights reserved.

AB - The effects of UVC exposure on the track etch rate Vt and the detector sensitivity V of CR-39 SSNTDs were investigated through the diameters and depths of alpha-particle tracks. Both the bulk etch rate Vb and Vt increased but V decreased. The track diameters and depths were used to derive a V function for CR-39 detectors with and without UV irradiation. © 2008 Elsevier Ltd. All rights reserved.

KW - Alpha particle

KW - CR-39

KW - Track etch

KW - Ultraviolet

UR - https://www.scopus.com/pages/publications/48549103174

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-48549103174&origin=recordpage

U2 - 10.1016/j.radmeas.2008.03.029

DO - 10.1016/j.radmeas.2008.03.029

M3 - RGC 21 - Publication in refereed journal

SN - 1350-4487

VL - 43

JO - Radiation Measurements

JF - Radiation Measurements

IS - SUPPL.1

ER -

Effects of UVC irradiation on alpha-particle track parameters in CR-39

Abstract

Research Keywords

Access Output

Other Access Options

Permanent Link

Other Files and Links

Fingerprint

Cite this