Effects of stirring on the bulk etch rate of CR-39 detector

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

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Author(s)

Detail(s)

Original languageEnglish
Pages (from-to)141-143
Journal / PublicationRadiation Measurements
Volume36
Issue number1-6 SPEC.
Publication statusPublished - Jun 2003

Abstract

It is well established that the bulk etch rates for solid state nuclear track detectors are affected by the concentration and the temperature of the etchant. Recently, we found that the bulk etch rate for the LR 115 detector to be affected by stirring during etching. In the present work, the effects of stirring on the bulk etch rate of the CR-39 detector is investigated. One set of sample was etched under continuous stirring by a magnetic stirrer at 70°C in a 6.25 N NaOH solution, while the other set of samples was etched without the magnetic stirrer. After etching, the bulk etch thickness was measured using Form Talysurf PGI (Taylor Hobson, Leicester, England). It was found that magnetic stirring did not affect the bulk etch of the CR-39 detector, which was in contrast to the results for the LR 115 detector. © 2003 Elsevier Ltd. All rights reserved.

Research Area(s)

  • Bulk etch rate, CR-39, Stirring

Citation Format(s)

Effects of stirring on the bulk etch rate of CR-39 detector. / Ho, J. P Y; Yip, C. W Y; Nikezic, D. et al.
In: Radiation Measurements, Vol. 36, No. 1-6 SPEC., 06.2003, p. 141-143.

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review