Effects of Refractoriness on the Statistics of the Post-Membrane Output IPIs

X. L. Hu, Y. T. Zhang

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

2 Citations (Scopus)

Abstract

Refractory period is an important factor that affects output inter-pulse intervals (IPIs) statistics at post-membrane of a gap junction. However this factor is seldom considered in analyses of the synaptic pulse train transmission. Based on the previous theoretical study, a general form of the p.d.f. of post-membrane output IPIs is obtained in this work. The exponential and Gaussian distributed input IPIs to the gap junction are used for verification, and the results show that the theoretical results are consistent with the simulated ones for the two cases studied.
Original languageEnglish
Title of host publicationProceedings of the 22nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society
EditorsJohn D. Enderle
Place of PublicationUSA
Pages589-591
Volume1
DOIs
Publication statusPublished - Jul 2000
Externally publishedYes
Event22nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society - Navy Pier Convention Center, Chicago, IL, United States
Duration: 23 Jul 200028 Jul 2000

Publication series

NamePROCEEDINGS OF ANNUAL INTERNATIONAL CONFERENCE OF THE IEEE ENGINEERING IN MEDICINE AND BIOLOGY SOCIETY
PublisherInstitute of Electrical and Electronics Engineers
ISSN (Print)1094_687X

Conference

Conference22nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society
PlaceUnited States
CityChicago, IL
Period23/07/0028/07/00

Research Keywords

  • Firing statistics
  • Gap junction
  • Refractory

Fingerprint

Dive into the research topics of 'Effects of Refractoriness on the Statistics of the Post-Membrane Output IPIs'. Together they form a unique fingerprint.

Cite this