@article{c8e2acf4a79f4d9fb7b90aeabb67b821,
title = "Effects of non-fatal electrostatic discharge on the threshold voltage degradation in nano CMOS devices",
keywords = "Nano CMOS, ESD, Reliability, Hot-carrier, Charge trapping",
author = "Hei WONG and Shurong DONG and Zehua CHEN",
note = "Information for this record is supplemented by the author(s) concerned.",
year = "2022",
month = feb,
doi = "10.1007/s11432-020-3197-8",
language = "English",
volume = "65",
pages = "1--2",
journal = "Science China Information Sciences",
issn = "1674-733X",
publisher = "Springer Nature and Science China Press",
number = "2",
}