Effects of graphene defect on electronic structures of its interface with organic semiconductor
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Pages (from-to) | 133502 - |
Journal / Publication | Applied Physics Letters |
Volume | 106 |
Issue number | 13 |
Publication status | Published - 30 Mar 2015 |
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DOI | DOI |
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Attachment(s) | Documents
Publisher's Copyright Statement
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Link to Scopus | https://www.scopus.com/record/display.uri?eid=2-s2.0-84961289046&origin=recordpage |
Permanent Link | https://scholars.cityu.edu.hk/en/publications/publication(88c86d3a-3fe8-4a4c-9883-c5c4cca2e630).html |
Abstract
Electronic structures of copper hexadecafluorophthalocyanine (F16CuPc)/graphene with different defect density were studied with ultra-violet photoelectron spectroscopy. We showed that the charge transfer interaction and charge flow direction can be interestingly tuned by controlling the defect density of graphene through time-controlled H-2 plasma treatment. By increasing the treatment time of H2 plasma from 30 s to 5 min, both the interface surface dipole and the electron transporting barrier at F16CuPc/graphene interface are significantly reduced from 0.86 to 0.56 eV and 0.71 to 0.29 eV, respectively. These results suggested that graphene's defect control is a simple approach for tuning electronic properties of organic/graphene interfaces. (C) 2015 AIP Publishing LLC.
Research Area(s)
Citation Format(s)
Effects of graphene defect on electronic structures of its interface with organic semiconductor. / Yang, Qing-Dan; Dou, Wei-Dong; Wang, Chundong et al.
In: Applied Physics Letters, Vol. 106, No. 13, 30.03.2015, p. 133502 -.
In: Applied Physics Letters, Vol. 106, No. 13, 30.03.2015, p. 133502 -.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
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