Effects of annealing temperature on excitonic emissions from Na-implanted ZnO nanorods

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

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Author(s)

  • Huibin Liu
  • Qiuyuan Lu
  • Haiping He
  • Kewei Wu
  • Shuili Li
  • Jingyun Huang
  • Yangfan Lu
  • Xinhua Pan
  • Zhizhen Ye

Detail(s)

Original languageEnglish
Pages (from-to)76-78
Journal / PublicationMaterials Letters
Volume90
Publication statusPublished - Jan 2013

Link(s)

DOI

DOI
Check@CityULib
Link to Scopus https://www.scopus.com/record/display.uri?eid=2-s2.0-84870713198&origin=recordpage
Permanent Link https://scholars.cityu.edu.hk/en/publications/publication(13f4ff62-5f15-4e45-9974-3d485f1c8413).html

Abstract

The effects of annealing temperature on excitonic emissions from Na + ion implanted ZnO nanorods are studied and annealing between 600 and 800 °C can effectively repair the implantation as evidenced by the enhanced excitonic emissions. A well-resolved bound exciton line at 3.352 eV with a linewidth of ∼2 meV emerges from 800 °C annealed sample and could be related to the formation of NaZn acceptor. When the annealing temperature is increased, the intensity of the I6-8 line decreases while that of I3 increases, suggesting enhanced ionization of neutral donors at elevated temperature. © 2012 Elsevier B.V.

Research Area(s)

  • Nanostructures, Photoluminescence, Semiconductors

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Publication fingerprints text

100
annealing INIS
100
nanostructures INIS
100
emission INIS
100
zinc oxides INIS
100
Temperature Material Science
100
Nanorod Material Science
100
ZnO Material Science
100
ZnO Nanorods Physics
100
Exciton Emission Keyphrases
100
Annealing Temperatu... Keyphrases
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Citation Format(s)

[ RIS ] [ BibTeX ]
Effects of annealing temperature on excitonic emissions from Na-implanted ZnO nanorods. / Liu, Huibin; Lu, Qiuyuan; He, Haiping et al.
In: Materials Letters, Vol. 90, 01.2013, p. 76-78.

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review