Effects of amorphous layer regrowth on carbon activation in GaAs and InP

A. J. Moll, J. W. Ager III, K. M. Yu, W. Walukiewicz, E. E. Haller

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

Abstract

The effect of the Ga dose on the activation of implanted carbon in GaAs is determined. The free hole concentration is found to depend on the depth of the amorphous layer created by the Ga co-implant. Initial results on C implantation in InP indicate the behavior of C is very different in InP when compared to GaAs. The role of precipitation in reducing the activation of C in both GaAs and InP is discussed.
Original languageEnglish
Title of host publicationMaterials Research Society Symposium Proceedings
PublisherPubl by Materials Research Society
Pages325-330
Volume316
ISBN (Print)1558992154
Publication statusPublished - 1994
Externally publishedYes
Event1993 Materials Research Society (MRS) Fall Meeting - Boston, MA, United States
Duration: 29 Nov 19933 Dec 1993
https://www.mrs.org/fall1993

Publication series

Name
Volume316
ISSN (Electronic)0272-9172

Conference

Conference1993 Materials Research Society (MRS) Fall Meeting
PlaceUnited States
CityBoston, MA
Period29/11/933/12/93
Internet address

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