Abstract
The effect of the Ga dose on the activation of implanted carbon in GaAs is determined. The free hole concentration is found to depend on the depth of the amorphous layer created by the Ga co-implant. Initial results on C implantation in InP indicate the behavior of C is very different in InP when compared to GaAs. The role of precipitation in reducing the activation of C in both GaAs and InP is discussed.
| Original language | English |
|---|---|
| Title of host publication | Materials Research Society Symposium Proceedings |
| Publisher | Publ by Materials Research Society |
| Pages | 325-330 |
| Volume | 316 |
| ISBN (Print) | 1558992154 |
| Publication status | Published - 1994 |
| Externally published | Yes |
| Event | 1993 Materials Research Society (MRS) Fall Meeting - Boston, MA, United States Duration: 29 Nov 1993 → 3 Dec 1993 https://www.mrs.org/fall1993 |
Publication series
| Name | |
|---|---|
| Volume | 316 |
| ISSN (Electronic) | 0272-9172 |
Conference
| Conference | 1993 Materials Research Society (MRS) Fall Meeting |
|---|---|
| Place | United States |
| City | Boston, MA |
| Period | 29/11/93 → 3/12/93 |
| Internet address |
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