Abstract
To efficiently support quality of service (QoS) in future wireless networks, it is important to model a wireless channel in terms of connection-level QoS metrics such as data rate, delay and delay-violation probability. To achieve this, in [7], we proposed and developed a link-layer channel model termed effective capacity (EC) for flat fading channels. In this paper, we apply the effective capacity technique to modeling frequency selective fading channels. Specifically, we utilize the duality between the distribution of a queue with superposition of N i.i.d. sources, and the distribution of a queue with a frequency-selective fading channel that consists of N i.i.d. sub-channels, to model a frequency selective fading channel. In the proposed model, a frequency selective fading channel is modeled by three EC functions; we also propose a simple and efficient algorithm to estimate these EC functions. Simulation results show that the actual QoS metric is closely approximated by the QoS metric predicted by the proposed EC channel model. The accuracy of the prediction using our model can translate into efficiency in admission control and resource reservation. © Springer Science + Business Media, LLC 2007.
| Original language | English |
|---|---|
| Pages (from-to) | 299-310 |
| Journal | Wireless Networks |
| Volume | 13 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - Jun 2007 |
| Externally published | Yes |
Bibliographical note
Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].Research Keywords
- Delay
- Frequency-selective fading
- Large deviations theory
- QoS
- Wireless channel model
Fingerprint
Dive into the research topics of 'Effective capacity channel model for frequency-selective fading channels'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver