Effect of water and oxygen on the electronic structure of the organic photovoltaic

Q. D. Yang; Tsz-Wai Ng; Ming-Fai Lo; F. Y. Wang; N. B. Wong; Chun-Sing Lee

doi:10.1021/jp300316x

Effect of water and oxygen on the electronic structure of the organic photovoltaic

Q. D. Yang, Tsz-Wai Ng, Ming-Fai Lo, F. Y. Wang, N. B. Wong, Chun-Sing Lee

Centre of Super-Diamond and Advanced Films

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

17 Citations (Scopus)

Abstract

Effects of water and oxygen exposures on electronic structures of the bathocuproine (BCP)/fullerene (C ₆₀) interface were studied by photoemission spectroscopies. C ₆₀ in BCP/C ₆₀ interface prepared under ultrahigh vacuum (UHV) shows a downward energy level bending of 0.3 eV. The energy level bending of C ₆₀ significantly increases to ∼0.8 eV upon exposure to water moisture or oxygen gas at 5 × 10 ^-6 Torr for 30 min. The results suggest the formation of electron traps at the C ₆₀/BCP interface upon water or moisture exposure. The decrease in electron transporting barrier between the lowest unoccupied molecular orbital (LUMO) of C ₆₀ and metal-induced gap states in BCP upon metal deposition encourages the charge leakage from cathode to C ₆₀. Charge recombination in C ₆₀ upon water or oxygen exposure is also discussed. © 2012 American Chemical Society.

Original language	English
Pages (from-to)	10982-10985
Journal	The Journal of Physical Chemistry C
Volume	116
Issue number	20
DOIs	https://doi.org/10.1021/jp300316x
Publication status	Published - 24 May 2012

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title = "Effect of water and oxygen on the electronic structure of the organic photovoltaic",

abstract = "Effects of water and oxygen exposures on electronic structures of the bathocuproine (BCP)/fullerene (C 60) interface were studied by photoemission spectroscopies. C 60 in BCP/C 60 interface prepared under ultrahigh vacuum (UHV) shows a downward energy level bending of 0.3 eV. The energy level bending of C 60 significantly increases to ∼0.8 eV upon exposure to water moisture or oxygen gas at 5 × 10 -6 Torr for 30 min. The results suggest the formation of electron traps at the C 60/BCP interface upon water or moisture exposure. The decrease in electron transporting barrier between the lowest unoccupied molecular orbital (LUMO) of C 60 and metal-induced gap states in BCP upon metal deposition encourages the charge leakage from cathode to C 60. Charge recombination in C 60 upon water or oxygen exposure is also discussed. {\textcopyright} 2012 American Chemical Society.",

author = "Yang, {Q. D.} and Tsz-Wai Ng and Ming-Fai Lo and Wang, {F. Y.} and Wong, {N. B.} and Chun-Sing Lee",

year = "2012",

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doi = "10.1021/jp300316x",

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TY - JOUR

T1 - Effect of water and oxygen on the electronic structure of the organic photovoltaic

AU - Yang, Q. D.

AU - Ng, Tsz-Wai

AU - Lo, Ming-Fai

AU - Wang, F. Y.

AU - Wong, N. B.

AU - Lee, Chun-Sing

PY - 2012/5/24

Y1 - 2012/5/24

N2 - Effects of water and oxygen exposures on electronic structures of the bathocuproine (BCP)/fullerene (C 60) interface were studied by photoemission spectroscopies. C 60 in BCP/C 60 interface prepared under ultrahigh vacuum (UHV) shows a downward energy level bending of 0.3 eV. The energy level bending of C 60 significantly increases to ∼0.8 eV upon exposure to water moisture or oxygen gas at 5 × 10 -6 Torr for 30 min. The results suggest the formation of electron traps at the C 60/BCP interface upon water or moisture exposure. The decrease in electron transporting barrier between the lowest unoccupied molecular orbital (LUMO) of C 60 and metal-induced gap states in BCP upon metal deposition encourages the charge leakage from cathode to C 60. Charge recombination in C 60 upon water or oxygen exposure is also discussed. © 2012 American Chemical Society.

AB - Effects of water and oxygen exposures on electronic structures of the bathocuproine (BCP)/fullerene (C 60) interface were studied by photoemission spectroscopies. C 60 in BCP/C 60 interface prepared under ultrahigh vacuum (UHV) shows a downward energy level bending of 0.3 eV. The energy level bending of C 60 significantly increases to ∼0.8 eV upon exposure to water moisture or oxygen gas at 5 × 10 -6 Torr for 30 min. The results suggest the formation of electron traps at the C 60/BCP interface upon water or moisture exposure. The decrease in electron transporting barrier between the lowest unoccupied molecular orbital (LUMO) of C 60 and metal-induced gap states in BCP upon metal deposition encourages the charge leakage from cathode to C 60. Charge recombination in C 60 upon water or oxygen exposure is also discussed. © 2012 American Chemical Society.

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U2 - 10.1021/jp300316x

DO - 10.1021/jp300316x

M3 - RGC 21 - Publication in refereed journal

SN - 1932-7447

VL - 116

SP - 10982

EP - 10985

JO - The Journal of Physical Chemistry C

JF - The Journal of Physical Chemistry C

IS - 20

ER -

Effect of water and oxygen on the electronic structure of the organic photovoltaic

Abstract

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