Effect of substrate temperature on the formation of shallow silicide contacts on Si using Pd-W and Pt-W alloys
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
---|---|
Pages (from-to) | 87-89 |
Journal / Publication | Applied Physics Letters |
Volume | 37 |
Issue number | 1 |
Publication status | Published - 1980 |
Externally published | Yes |
Link(s)
Abstract
We have investigated the effect of substrate temperature on the reaction between Si and Pd-W and Pt-W alloys by I-V measurement of Schottky barrier height. We found that by maintaining a substrate temperature of 100°C during the deposition of W-rich Pd20W80 alloys, Schottky contacts of Pd2Si on Si can be obtained without any subsequent annealing. Similarly, a substrate temperature of 300°C enables the formation of PtSi during the depostion of W-rich Pt20W80 alloys. For Pd-rich Pd80W20 and Pt-rich Pt80W 20 alloys, the substrate-temperature effect is not as significant as for the W-rich alloys.
Bibliographic Note
Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].
Citation Format(s)
Effect of substrate temperature on the formation of shallow silicide contacts on Si using Pd-W and Pt-W alloys. / Eizenberg, M.; Ottaviani, G.; Tu, K. N.
In: Applied Physics Letters, Vol. 37, No. 1, 1980, p. 87-89.
In: Applied Physics Letters, Vol. 37, No. 1, 1980, p. 87-89.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review