Effect of orientation on the ferroelectric behavior of (Pb,Sr)TiO 3 thin films

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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Author(s)

  • Jiwei Zhai
  • Xi Yao
  • Zhengkui Xu
  • Haydn Chen

Detail(s)

Original languageEnglish
Pages (from-to)354-357
Journal / PublicationJournal of the American Ceramic Society
Volume89
Issue number1
Publication statusPublished - Jan 2006

Abstract

Pb0.6Sr0.4TiO3 (PST) ferroelectric thin films were prepared on two different substrates by sol-gel methods. Films derived on the LaNiO(LNO)/Pt/Ti/SiO2/Si substrates showed a strong (100) preferred orientation. The PST thin films grown on the LNO/Pt/Ti/SiO 2/Si(100) substrate showed a non-uniform rounded grain size distribution and have a larger polarization and lower coercive field E c. The dependence of electrical properties derived on the Pt/Ti/SiO2/Si and LNO/Pt/Ti/SiO2/Si substrates has been studied, with a focus on the change of dielectric constant versus direct current (DC) bias field. The dielectric and ferroelectric properties of the Pb 0.6Sr0.4TiO3 thin films deposition on two kinds of substrates were investigated as a function of temperature, frequency and DC bias field. © 2005 by The American Ceramic Society.

Citation Format(s)

Effect of orientation on the ferroelectric behavior of (Pb,Sr)TiO 3 thin films. / Zhai, Jiwei; Yao, Xi; Xu, Zhengkui; Chen, Haydn.

In: Journal of the American Ceramic Society, Vol. 89, No. 1, 01.2006, p. 354-357.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review