Abstract
The effect of nano Ni additions in Sn-9Zn and Sn-8Zn-3Bi solders on their interfacial microstructures and shear strengths with Au/Ni/Cu pad metallization in ball grid array (BGA) applications were investigated. After addition ofnano Ni powder in Sn-based lead-free solders, there was no significant changes in the interfacial microstructure. But, in the solder region a very fine Zn phase was observed. Also, on the fracture surfaces fine Zn-Ni compound was found. After addition of nano Ni powder in Sn-based solders, the shear loads were increased and in addition, ductile fracture surfaces were clearly observed. The shear loads of Sn-9Zn and Sn-8Zn3-Bi solder were about 1798 gm and 2059 gm, respectively. After addition of nano Ni powder, their strengths were about 2172 gm and 2212 gm, respectively. ©2008 IEEE.
| Original language | English |
|---|---|
| Title of host publication | Proceedings - 2008 2nd Electronics Systemintegration Technology Conference, ESTC |
| Pages | 1291-1294 |
| DOIs | |
| Publication status | Published - 2008 |
| Event | 2008 2nd Electronics Systemintegration Technology Conference, ESTC - Greenwich, United Kingdom Duration: 1 Sept 2008 → 4 Sept 2008 |
Conference
| Conference | 2008 2nd Electronics Systemintegration Technology Conference, ESTC |
|---|---|
| Place | United Kingdom |
| City | Greenwich |
| Period | 1/09/08 → 4/09/08 |
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