Effect of ESD injection locations on induced noise inside a shielded enclosure

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journal

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Original languageEnglish
Pages (from-to)203-206
Journal / PublicationMicrowave and Optical Technology Letters
Volume38
Issue number3
Publication statusPublished - 5 Aug 2003

Abstract

Electrostatic discharge (ESD) on the metallic enclosure of electronic products normally generates unwanted radiated electromagnetic interference (EMI). The radiated EMI penetrates through the apertures on the enclosure and then couples to the circuitries inside the enclosure. This may cause malfunction and signal errors to the circuitries. In this paper, an experimental investigation on the effects of induced noise level caused due to different injection locations of ESD on the metallic enclosure with different aperture sizes is carried out. Results show that the induced voltage is highly sensitive to injection location of ESD.

Research Area(s)

  • Aperture, ESD, Metallic enclosure