Abstract
Electrostatic discharge (ESD) on the metallic enclosure of electronic products normally generates unwanted radiated electromagnetic interference (EMI). The radiated EMI penetrates through the apertures on the enclosure and then couples to the circuitries inside the enclosure. This may cause malfunction and signal errors to the circuitries. In this paper, an experimental investigation on the effects of induced noise level caused due to different injection locations of ESD on the metallic enclosure with different aperture sizes is carried out. Results show that the induced voltage is highly sensitive to injection location of ESD.
Original language | English |
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Pages (from-to) | 203-206 |
Journal | Microwave and Optical Technology Letters |
Volume | 38 |
Issue number | 3 |
DOIs | |
Publication status | Published - 5 Aug 2003 |
Research Keywords
- Aperture
- ESD
- Metallic enclosure