Effect of ESD injection locations on induced noise inside a shielded enclosure

K. H. Chan; L. C. Fung; S. W. Leung

doi:10.1002/mop.11015

Effect of ESD injection locations on induced noise inside a shielded enclosure

K. H. Chan, L. C. Fung, S. W. Leung

Department of Electrical Engineering

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

Abstract

Electrostatic discharge (ESD) on the metallic enclosure of electronic products normally generates unwanted radiated electromagnetic interference (EMI). The radiated EMI penetrates through the apertures on the enclosure and then couples to the circuitries inside the enclosure. This may cause malfunction and signal errors to the circuitries. In this paper, an experimental investigation on the effects of induced noise level caused due to different injection locations of ESD on the metallic enclosure with different aperture sizes is carried out. Results show that the induced voltage is highly sensitive to injection location of ESD.

Original language	English
Pages (from-to)	203-206
Journal	Microwave and Optical Technology Letters
Volume	38
Issue number	3
DOIs	https://doi.org/10.1002/mop.11015
Publication status	Published - 5 Aug 2003

Research Keywords

Aperture
ESD
Metallic enclosure

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title = "Effect of ESD injection locations on induced noise inside a shielded enclosure",

abstract = "Electrostatic discharge (ESD) on the metallic enclosure of electronic products normally generates unwanted radiated electromagnetic interference (EMI). The radiated EMI penetrates through the apertures on the enclosure and then couples to the circuitries inside the enclosure. This may cause malfunction and signal errors to the circuitries. In this paper, an experimental investigation on the effects of induced noise level caused due to different injection locations of ESD on the metallic enclosure with different aperture sizes is carried out. Results show that the induced voltage is highly sensitive to injection location of ESD.",

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author = "Chan, {K. H.} and Fung, {L. C.} and Leung, {S. W.}",

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TY - JOUR

T1 - Effect of ESD injection locations on induced noise inside a shielded enclosure

AU - Chan, K. H.

AU - Fung, L. C.

AU - Leung, S. W.

PY - 2003/8/5

Y1 - 2003/8/5

N2 - Electrostatic discharge (ESD) on the metallic enclosure of electronic products normally generates unwanted radiated electromagnetic interference (EMI). The radiated EMI penetrates through the apertures on the enclosure and then couples to the circuitries inside the enclosure. This may cause malfunction and signal errors to the circuitries. In this paper, an experimental investigation on the effects of induced noise level caused due to different injection locations of ESD on the metallic enclosure with different aperture sizes is carried out. Results show that the induced voltage is highly sensitive to injection location of ESD.

AB - Electrostatic discharge (ESD) on the metallic enclosure of electronic products normally generates unwanted radiated electromagnetic interference (EMI). The radiated EMI penetrates through the apertures on the enclosure and then couples to the circuitries inside the enclosure. This may cause malfunction and signal errors to the circuitries. In this paper, an experimental investigation on the effects of induced noise level caused due to different injection locations of ESD on the metallic enclosure with different aperture sizes is carried out. Results show that the induced voltage is highly sensitive to injection location of ESD.

KW - Aperture

KW - ESD

KW - Metallic enclosure

UR - http://www.scopus.com/inward/record.url?scp=0037773633&partnerID=8YFLogxK

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-0037773633&origin=recordpage

U2 - 10.1002/mop.11015

DO - 10.1002/mop.11015

M3 - RGC 21 - Publication in refereed journal

SN - 0895-2477

VL - 38

SP - 203

EP - 206

JO - Microwave and Optical Technology Letters

JF - Microwave and Optical Technology Letters

IS - 3

ER -

Effect of ESD injection locations on induced noise inside a shielded enclosure

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