@article{2526306b3b3542e587f3849af811d010,
title = "Editorial",
author = "Asen Asenov and Ulf Schichtmann and Tan, {Cher Ming} and Hei Wong and Xing Zhou",
note = "Full text of this publication does not contain sufficient affiliation information. With consent from the author(s) concerned, the Research Unit(s) information for this record is based on the existing academic department affiliation of the author(s).",
year = "2016",
month = jun,
day = "1",
doi = "10.1016/j.microrel.2016.03.028",
language = "English",
volume = "61",
pages = "1--2",
journal = "Microelectronics Reliability",
issn = "0026-2714",
publisher = "Elsevier Ltd.",
}