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Early software reliability prediction with extended ANN model

Q. P. Hu, Y. S. Dai, M. Xie, S. H. Ng

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

Abstract

Generally, software reliability models can provide accurate reliability measurement in the later phase of testing. However, predictions in the early phase of software testing are useful as cost-effective and timely feedback. Early prediction is also feasible in practice with information from previous releases or similar projects. Such information has been utilized well for early reliability prediction with NHPP models by assuming the same failure rate between two similar projects. Alternatively, in this paper, we propose to "reuse " failure data from past projects/releases with ANN models to improve early reliability for current project/release. To illustrate the proposed approach, two numerical examples are developed. Better prediction performance is observed in early phase of testing compared with original ANN model without failure data reuse. Furthermore, the optimal switching point from proposed approach to original ANN model in the whole testing phase is studied, with specific analysis on the two examples. © 2006 IEEE.
Original languageEnglish
Title of host publicationProceedings - International Computer Software and Applications Conference
Pages234-239
Volume2
DOIs
Publication statusPublished - 2006
Externally publishedYes
Event30th Annual International Computer Software and Applications Conference, COMPSAC 2006 - Chicago, IL, United States
Duration: 17 Sept 200621 Sept 2006

Publication series

Name
Volume2
ISSN (Print)0730-3157

Conference

Conference30th Annual International Computer Software and Applications Conference, COMPSAC 2006
PlaceUnited States
CityChicago, IL
Period17/09/0621/09/06

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