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E3: Ensemble of Expert Embedders for Adapting Synthetic Image Detectors to New Generators Using Limited Data

  • Aref Azizpour
  • , Tai D. Nguyen
  • , Manil Shrestha
  • , Kaidi Xu
  • , Edward Kim
  • , Matthew C. Stamm

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

Abstract

As generative AI progresses rapidly, new synthetic image generators continue to emerge at a swift pace. Traditional detection methods face two main challenges in adapting to these generators: the forensic traces of synthetic images from new techniques can vastly differ from those learned during training, and access to data for these new generators is often limited. To address these issues, we introduce the Ensemble of Expert Embedders (E3), a novel continual learning framework for updating synthetic image detectors. E3 enables the accurate detection of images from newly emerged generators using minimal training data. Our approach does this by first employing transfer learning to develop a suite of expert embedders, each specializing in the forensic traces of a specific generator. Then, all embeddings are jointly analyzed by an Expert Knowledge Fusion Network to produce accurate and reliable detection decisions. Our experiments demonstrate that E3 outperforms existing continual learning methods, including those developed specifically for synthetic image detection. © 2024 IEEE.
Original languageEnglish
Title of host publicationProceedings - 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops
Subtitle of host publicationCVPRW 2024
PublisherIEEE
Pages4334-4344
ISBN (Electronic)9798350365474
ISBN (Print)979-8-3503-6548-1
DOIs
Publication statusPublished - 2024
Externally publishedYes
Event2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW 2024) - Seattle, United States
Duration: 16 Jun 202422 Jun 2024

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW 2024)
PlaceUnited States
CitySeattle
Period16/06/2422/06/24

Funding

This material is based on research sponsored by DARPA and the Air Force Research Laboratory (AFRL) under agreement number HR0011-20-C-0126 and by the National Science Foundation under Award No. 2320600.

Research Keywords

  • Contniual Learning
  • Multimedia Forensics
  • Synthetic Image Detection
  • Synthetic Images
  • Transformers

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