Abstract
Recent advancements in aberration-corrected electron microscopy allow for an evaluation of unexpectedly large atom displacements beyond a resolution limit of ~0.5. Å, which are found to be dose-rate dependent in high resolution images. In this paper we outline a consistent description of the electron scattering process, which explains these unexpected phenomena. Our approach links thermal diffuse scattering to electron beam-induced object excitation and relaxation processes, which strongly contribute to the image formation process. The effect can provide an explanation for the well-known contrast mismatch ("Stobbs factor") between image calculations and experiments.
| Original language | English |
|---|---|
| Pages (from-to) | 158-163 |
| Journal | Micron |
| Volume | 68 |
| Online published | 16 Sept 2014 |
| DOIs | |
| Publication status | Published - Jan 2015 |
| Externally published | Yes |
Research Keywords
- Dose rate dependence
- Quantitative HREM
- TDS
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