Disconnection-mediated migration of interfaces in microstructures : I. continuum model
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Related Research Unit(s)
Detail(s)
Original language | English |
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Article number | 117178 |
Journal / Publication | Acta Materialia |
Volume | 227 |
Online published | 29 Jul 2021 |
Publication status | Published - 1 Apr 2022 |
Link(s)
Abstract
A long-standing goal of materials science is to understand, predict and control the evolution of microstructures in crystalline materials. Most microstructure evolution is controlled by interface motion; hence, the establishment of rigorous interface equations of motion is a universal goal of materials science. We present a new model for the motion of arbitrarily curved interfaces that respects the underlying crystallography of the two phases/domains meeting at the interface and is consistent with microscopic mechanisms of interface motion; i.e., disconnection migration (line defects in the interface with step and dislocation character). We derive the equation of motion for interface migration under the influence of a wide range of driving forces. In Part II of this paper [Salvalaglio, Han and Srolovitz, 2021], we implement the interface model and the equation of motion proposed in this paper in a diffuse interface simulation approach for complex morphology and microstructure evolution.
Research Area(s)
- Continuum modeling, Disconnections, Grain boundaries, Interfaces, Microstructure
Citation Format(s)
Disconnection-mediated migration of interfaces in microstructures: I. continuum model. / Han, Jian; Srolovitz, David J.; Salvalaglio, Marco.
In: Acta Materialia, Vol. 227, 117178, 01.04.2022.
In: Acta Materialia, Vol. 227, 117178, 01.04.2022.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review