Directional statistics-based deep metric learning for image classification and retrieval
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Related Research Unit(s)
Detail(s)
Original language | English |
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Pages (from-to) | 113-123 |
Journal / Publication | Pattern Recognition |
Volume | 93 |
Online published | 10 Apr 2019 |
Publication status | Published - Sept 2019 |
Link(s)
Abstract
L2-normalization is an effective method to enhance the discriminant power of deep representation learning. However, without exploiting the geometric properties of the feature space, the generally used gradient based optimization methods are failed to track the global information during training. In this paper, we propose a novel deep metric learning model based on the directional distribution. By defining the loss function based on the von Mises–Fisher distribution, we propose an effective alternative learning algorithm by periodically updating the class centers. The proposed metric learning not only captures the global information about the embedding space but also yields an approximate representation of the class distribution during training. Considering classification and retrieval tasks, our experiments on benchmark datasets demonstrate an improvement from the proposed algorithm. Particularly, with a small number of convolutional layers, a significant accuracy upsurge can be observed compared to widely used gradient-based methods.
Research Area(s)
- Deep distance metric learning, Directional statistics, Image retrieval, Image similarity learning
Citation Format(s)
Directional statistics-based deep metric learning for image classification and retrieval. / Zhe, Xuefei; Chen, Shifeng; Yan, Hong.
In: Pattern Recognition, Vol. 93, 09.2019, p. 113-123.
In: Pattern Recognition, Vol. 93, 09.2019, p. 113-123.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review