Direct Time-Resolved Observation of Carrier Trapping and Polaron Conductivity in BiVO4

Manuel Ziwritsch, Sönke Müller, Hannes Hempel, Thomas Unold, Fatwa F. Abdi, Roel Van De Krol, Dennis Friedrich, Rainer Eichberger*

*Corresponding author for this work

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

122 Citations (Scopus)

Abstract

BiVO4 is a promising photoanode candidate for water splitting applications, but its microscopic charge carrier transport properties are not yet fully understood. We investigated the photoinduced carrier mobility for undoped and 1% tungsten-doped BiVO4 thin films in an early time window from 1 ps to 1 ns using THz spectroscopy. The combined electron-hole effective mobility gradually decreases with time by 1 order of magnitude starting at an upper limit of ∼0.4 cm2 V-1 s-1. The loss is attributed to carrier localization. We provide for the first time direct time-resolved evidence of hole polaron formation accompanied by the temporal buildup of a polaron population in parallel to initial carrier trapping. A mobility of 0.02 cm2 V-1 s-1 is found for the self-trapped carriers, which leads to a thermal hopping activation energy of ∼90 meV. © 2016 American Chemical Society.
Original languageEnglish
Pages (from-to)888-894
JournalACS Energy Letters
Volume1
Issue number5
DOIs
Publication statusPublished - 11 Nov 2016
Externally publishedYes

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